Register to join the workshop
Experience in-person ZEISS comprehensive solutions at ZEISS Quality Excellence Center!
Registration form
![]({"xsmall":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original.image_file.100.100.file/vn_qec_contura-01_1x1_1000px.jpg","small":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original.image_file.360.360.file/vn_qec_contura-01_1x1_1000px.jpg","medium":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original.image_file.768.768.file/vn_qec_contura-01_1x1_1000px.jpg","large":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original./vn_qec_contura-01_1x1_1000px.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original./vn_qec_contura-01_1x1_1000px.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original./vn_qec_contura-01_1x1_1000px.jpg","max":"https://www.zeiss.com.sg/content/dam/iqs/singapore/image/vn_qec_contura-01_1x1_1000px.jpg/_jcr_content/renditions/original./vn_qec_contura-01_1x1_1000px.jpg"}){kind=spacer}
You are facing difficult and complex measurement tasks? Are you developing a new product but lack the resources? Or do you want to receive advice to optimize processes and enhance productivity?
Contact our experts from the ZEISS Quality Excellence Center (QEC) in Vietnam to receive the necessary support for offline programming, measurement services (CMM, microscopy), 3D scanning, CT imaging, and much more.
Explore ZEISS Industrial Quality Assurance Solutions
![]({"xsmall":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original.image_file.100.100.file/zeiss_metrotom_1500_1920_1920.jpg","small":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original.image_file.360.360.file/zeiss_metrotom_1500_1920_1920.jpg","medium":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original.image_file.768.768.file/zeiss_metrotom_1500_1920_1920.jpg","large":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/zeiss_metrotom_1500_1920_1920.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/zeiss_metrotom_1500_1920_1920.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/zeiss_metrotom_1500_1920_1920.jpg","max":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/x-ray/3d-x-ray/metrotom-1500/zeiss_metrotom_1500_1920_1920.jpg/_jcr_content/renditions/original./zeiss_metrotom_1500_1920_1920.jpg"})
ZEISS METROTOM 1500
▪ Reduce scanning time by up to 75% with 3D X-ray inspection
▪ Automated measurement with traceability
![]({"xsmall":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.100.100.250,0,2250,2000.file/evos_solo_sigma.jpg","small":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.360.360.250,0,2250,2000.file/evos_solo_sigma.jpg","medium":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.768.768.250,0,2250,2000.file/evos_solo_sigma.jpg","large":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.1024.1024.250,0,2250,2000.file/evos_solo_sigma.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.1280.1280.250,0,2250,2000.file/evos_solo_sigma.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.1440.1440.250,0,2250,2000.file/evos_solo_sigma.jpg","max":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/industrial-microscopy/electron-microscopes/sigma/evos_solo_sigma.jpg/_jcr_content/renditions/original.image_file.1920.1920.250,0,2250,2000.file/evos_solo_sigma.jpg"})
ZEISS Sigma 360
▪ Imaging of raw materials at the nano and micro level
▪ Combined with EDS for surface analysis and elemental composition assessment
![]({"xsmall":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg","small":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg","medium":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg","large":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.1024.1024.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.1280.1280.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg","max":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/bridge-cmms/contura/print_studio_contura_klein_htg_links.jpg/_jcr_content/renditions/original.image_file.1440.1440.240,0,1680,1440.file/print_studio_contura_klein_htg_links.jpg"})
ZEISS CONTURA
▪ Precise inspection of electrodes and products
▪ Comparison with CAD models