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Events Industrial Metrology
Quality in Focus
29/10/2019
USA / Dayton, OH
Quality in Focus: Transitioning Additive Manufacturing from Prototyping to Production
Come to the University of Dayton Research Institute on Tuesday, October 29th to learn first-hand from the experts about:
Advances in additive manufacturing (AM) technology and need for comprehensive characterization – presented by Ryan Dehoff, Ph.D., Oak Ridge National Laboratory-Manufacturing Demonstration Facility (ORNL-MDF)
Current qualification standards and future requirements for the metal AM segment – presented by Shaw P. Moylan, Ph.D., NIST
Multi-scale multi-modal characterization for AM processes and parts – presented by Marcin Bauza, Ph.D., ZEISS Industrial Quality Solutions
Additive Manufacturing: From research & development to production – presented by Brian Stitt, Tom Woellert, Timothy Osborn, Ph.D., UDRI
Lunch will be provided and you'll have time to network with other industry professionals.