
Built For Semiconductor Production
How Can ZEISS's Failure Analysis Correlative Workflow Help You?
Helping You Succeed In Semiconductor Failure Analysis
ZEISS X-Ray Microscopes (XRM) and Scanning Electron Microscopes (SEM) are advanced imaging tools that play a crucial role in semiconductor failure analysis. These instruments enable high-resolution imaging and analysis of the internal structures and materials of a sample.
The XRM provides elemental and compositional analysis by generating high-resolution images of a sample using X-rays, while the SEM generates high-resolution images by scanning a sample with an electron beam. The combination of these two imaging techniques provides a comprehensive view of a sample, which is essential for identifying the root cause of a failure in semiconductors.
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ZEISS's Correlative Failure Analysis Workflow
Learn How ZEISS Can Help You With Your Semiconductor Production
