See how other researchers are using ZEISS GeminiSEM

The ZEISS GeminiSEM 500 SEM has been in use for more than 6 years. As an important tool for material science research, it is one of the most frequently used large-scale equipment in our center, serving more than 2000 hours for teachers and students every year. The ZEISS GeminiSEM 500 SEM provides indispensable technical support for many research groups at the university.

In 2022, it supported more than 50 major projects, including National Natural Science Foundation projects, National Outstanding Youth Science Fund projects, and National Key R&D programs. It also supported more than 200 SCI papers and over 60 EI and CSCD papers. In addition, it provides high-resolution SEM testing for universities, research institutes, and high-tech enterprises in surrounding areas.

We are the first in the country to offer electron microscopy experimental training courses for graduate students. Students develop hands-on skills and learn to independently operate large equipment to solve scientific research problems. After completing the course, they receive credits and a computer operation certificate, which qualifies them to independently operate SEM in future research work.

The ZEISS Gemini design represents a major advancement in electron microscopy. Its parallel electron beam technology delivers excellent resolution while maintaining beam flow. The system also offers a large sample chamber and multiple flange interfaces, which enable flexible integration of third-party accessories such as energy spectrum and EBSD. It also supports extension devices such as in-situ stretching and heating stages, making in-situ experiments convenient and safe.

ZEISS equipment delivers reliable performance and strong technical support. The ZEISS GeminiSEM 500 SEM has operated stably for more than 6 years. Local application and service engineers ensure fast response and efficient maintenance.

At the 3D Printing Quality Evaluation Center, my work focuses on 3D-related R&D, material and output analysis, and technical support for small and medium-sized enterprises. Before using the ZEISS GeminiSEM, high voltage was required for high-resolution imaging, which caused surface damage on polymer specimens. For non-conductive materials such as porous structures or ceramics, surface charging made it difficult to obtain high-quality images.

To reduce charging, we previously applied coatings. Preparation took more than 15 minutes and limited analysis to surface observation. With the ZEISS GeminiSEM column, high-resolution imaging at low kV enables analysis of beam-sensitive and non-conductive samples with complex structures. It is also effective for magnetic samples.

I use the ZEISS GeminiSEM column to image 3D printing materials such as polymers, metal powders, and composites. For metal powders like STS316L, 17-4PH, and Inconel718, it supports analysis of morphology, sphericity, particle size distribution, and density. It also supports R&D for magnetic cores, electronic devices, and industrial components.

For medical materials such as PE, PS, TPU, and polyurethane thermoplastics, it supports mechanical and thermal characterization as well as density analysis. It is also used for additive analysis, adhesion analysis, and thermal stability testing in composites and industrial outputs.

The ZEISS GeminiSEM column enables clear observation of interfaces between fibers and base materials, supporting optimization of composite structures. It also enables detailed cross-section analysis and defect imaging in spherical powders. Compared to previous methods, it provides more accurate particle size and distribution data.

The ZEISS GeminiSEM column supports a wide range of materials and applications. It delivers high-quality images quickly, improving research efficiency. 

The users of the Carl ZEISS GeminiSEM 300 work on nanomaterials, thin films, metal and ceramic composites, and microbial cells. Morphology, surface composition, and dimensional analysis are routine requirements at the institute.

We use secondary electron imaging and energy dispersive spectroscopy (EDS) extensively on the ZEISS GeminiSEM column. The backscattered electron detector (BSD) also supports compositional analysis of nanomaterial surfaces.

My research group develops sensors based on nanostructures. The ZEISS GeminiSEM 300 supports morphological and elemental composition studies of samples. We also develop immunosensors, where proper and site-specific antibody binding on graphene nanosheets requires verification using the ZEISS GeminiSEM.

We achieve high-quality secondary electron images and EDS spectra with the ZEISS GeminiSEM column.

The system represents a state-of-the-art field-emission scanning electron microscope. Multiple detectors capture different signals from the electron–sample interaction. The ZEISS GeminiSEM platform provides flexible detector ports and strong support from technical and service teams.