![]({"xsmall":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.100.100.file/placeholder-1-1.jpg","small":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.360.360.file/placeholder-1-1.jpg","medium":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.768.768.file/placeholder-1-1.jpg","large":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/placeholder-1-1.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original./placeholder-1-1.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original./placeholder-1-1.jpg","max":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original./placeholder-1-1.jpg"})
The impact of advanced SEM on materials characterization
Imaging and microanalysis at the “sweet spot”Today's scanning electron microscopes (SEMs) incorporate multiple detectors (multiple secondary electron detectors and multiple backscattered electron detectors), enabling observations that go beyond the surface topography observations possible with conventional SEMs, and reflect a variety of information (material type, crystal information, etc.).
To maximize the effectiveness of SEM, selecting appropriate observation conditions ("sweet spot") for the material is essential. This seminar explains the principles of image formation and presents practical application examples based on that understanding, enabling you to obtain rich information from SEM.
![]({"xsmall":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.100.67.0,173,1034,862.file/placeholder-1-1.jpg","small":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.360.240.0,173,1034,862.file/placeholder-1-1.jpg","medium":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.768.512.0,173,1034,862.file/placeholder-1-1.jpg","large":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.1024.683.0,173,1034,862.file/placeholder-1-1.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.1034.689.0,173,1034,862.file/placeholder-1-1.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.1034.689.0,173,1034,862.file/placeholder-1-1.jpg","max":"https://www.zeiss.com.sg/content/dam/system/archetypes/placeholder/placeholder-1-1.jpg/_jcr_content/renditions/original.image_file.1034.689.0,173,1034,862.file/placeholder-1-1.jpg"})
About the webinar
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Dr. Kaoru Sato is an expert on electron microscopy. His focus is on material surface design based on microstructure analysis, and his work has led to awards and innovations in many manufacturing sectors, including the auto industry and the world of microscopy itself. He completed his Ph.D. at the University of Cambridge in 1989. After serving as the head of the Analytical and Physical Properties Research Department and principal researcher at JFE Steel Corporation, he became a Fellow of JFE Techno Research in 2016.
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With this webinar, you learn: