ZEISS Microscopy

X-Ray Microscopy Solutions for Electronics and Semiconductors

Discover the ZEISS Xradia Context microCT

ZEISS Xradia Context is an easy-to-use, non-destructive 3D X-ray microcomputed tomography system built to address 3D characterization and inspection of large intact electronic packages and samples to reveal interior details in their full 3D context, as well as small components and IC packages at maximum geometric magnification to resolve fine features with high resolution and high contrast.

Built on the proven ZEISS Xradia platform, Xradia Context provides you with superb image quality, stability, and usability, along with an efficient workflow environment and high throughput scanning. From sample mounting to scan preparation, acquisition, multiGPU reconstruction, and image processing and analysis, experience an efficient high through-put workflow that gets you to results quickly.

Defective C4 Bumps Click to enlarge
Click to enlarge.

Features and benefits

 
 
• Analyze various electronics packages and components non-destructively in 3D
• Large high speed detector
• User friendly workflows and robust stage with software control
• Recipe based acquisition and advanced reconstruction options
• Optimized filters to enhance image quality and reduce beam hardening
• Dynamic hardware and software enabled ring artifact removal
• High stability environment
• Future upgrade compatible

Software

Create Efficient Workflows by Using The Simple Control System​

Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.​​

Benefit from:​

  • Internal camera for sample viewing​
  • Recipe control (set, save, recall)​
  • Multiple energies​
  • Multiple samples with Autoloader option​
  • Micropositioning capability with a simple mouse click
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Upgrades and Compatibility​

 

ZEISS X-ray microscopes are designed to be upgradeable and extendible with future innovations and developments to protect our customer’s investment. This ensures the microscope capabilities evolve with the advancements in leading edge technology.​
From ZEISS Xradia Context microCT, to ZEISS CrystalCT, to ZEISS Xradia 510/520 Versa, and now with the addition of ZEISS Xradia 610/620 Versa, users can field-convert their systems to the latest X ray microscopes.​

Flyer Download: Dive into the Details

ZEISS Xradia Context microCT

3D submicron-resolution X-ray microCT with superior image quality

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