In situ material testing in SEM: Achieve an unprecedented level of automation

In situ materials testing in scanning electron microscopy (SEM) is an emerging trend among SEM applications. The method is widely used to link the microstructure of a material with its macroscopic mechanical properties, by measuring the dynamical response of a material under mechanical load, in real time. When combined with further analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), the response of the material’s microstructure can be related to its chemical composition and crystallographic orientations. Understanding the relationship of the microstructures and properties of a material is essential for developing novel materials. Nevertheless, performing an in situ experiment in the SEM is a demanding task, due to poor integrations of in situ and analytical accessories. In this webinar, join Dr. Fang Zhou, manager of the business sector at ZEISS, as he introduces a fully integrated in situ solution in a field emission scanning electron microscope (FESEM), and explores automated workflows that can be used to generate meaningful data with high levels of reproducibility and precision.

Key Highlights

  • Highlights and benefits of a unique, fully integrated in situ solution and the technology behind it
  • How to overcome common challenges faced during in situ experiments
  • How this method compares with conventional in situ integrations
  • How to address challenging applications, including working with metals, alloys, additive manufacturing materials, and polymers

Speakers

Dr. Fang Zhou

Manager Business Sector in Materials Science
ZEISS Research Microscopy Solutions

Dr. Carrie Haslam

Associate Editor
SelectScience

Register for the on-demand webinar now!