ZEISS Microscopy Solutions for Polymers and Chemicals Research
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Polymers and soft materials challenge research fraternity to be imaged under any particle beam microscope, find out how ZEISS Electron Optics and X-ray Optics image them with ease and discover how their structure-property relationships are mapped in material science research with ZEISS Microscopy solutions.
![Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).]({"small":"https://images.zeiss.com/Microscopy/sg/2022/apac/ms-infographic_polymers-chemicals.ts-1643247271833.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=2b8a826e37edeb0a6fc30876bb092c83","large":"https://images.zeiss.com/Microscopy/sg/2022/apac/ms-infographic_polymers-chemicals.ts-1643247271833.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=1cd0449129831834b1d99f06718e4f42","medium":"https://images.zeiss.com/Microscopy/sg/2022/apac/ms-infographic_polymers-chemicals.ts-1643247271833.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=1aae372e366888a0b0e56d22ec279e2d","full":"https://images.zeiss.com/Microscopy/sg/2022/apac/ms-infographic_polymers-chemicals.ts-1643247271833.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=673d10b8a9750645533a5db3a24c52b1"} "Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).")