ZEISS Microscopy Solutions for Polymers and Chemicals Research

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Polymers and soft materials challenge research fraternity to be imaged under any particle beam microscope, find out how ZEISS Electron Optics and X-ray Optics image them with ease and discover how their structure-property relationships are mapped in material science research with ZEISS Microscopy solutions.

Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).

ZEISS Microscopy Solutions for Polymers and Chemicals Research

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