ZEISS Xradia Versa 3D X-ray Microscopes - Imaging buried defects non-destructively

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Xradia Versa has become the industry standard for non-destructive 3D imaging of intact samples with sub-micron resolution. The unique detector design has enabled high resolution characterization of various components such as camera lenses and defects in electronic packages and batteries faster than conventional physical cross-sectioning in smartphones and electronics devices.

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Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).

ZEISS Xradia Versa 3D X-ray Microscopes - Imaging buried defects non-destructively

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