Multi-scale microscopy for Advanced Battery Characterization
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![Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).]({"small":"https://images.zeiss.com/Microscopy/sg/apacwebinars2020/matscience-poster_multi-scale-materials-sciences.ts-1645668528672.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=aedda2bdc737ef9545c3208f7b311165","large":"https://images.zeiss.com/Microscopy/sg/apacwebinars2020/matscience-poster_multi-scale-materials-sciences.ts-1645668528672.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=6d062d4837716bee4e523965bca8f4bd","medium":"https://images.zeiss.com/Microscopy/sg/apacwebinars2020/matscience-poster_multi-scale-materials-sciences.ts-1645668528672.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=3e81b563286ae0b792ba077b46de5ffc","full":"https://images.zeiss.com/Microscopy/sg/apacwebinars2020/matscience-poster_multi-scale-materials-sciences.ts-1645668528672.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=d37ec4a498b32fe2506857b66e604dd7"} "Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).")
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