ZEISS EVO Solutions for Metals and Alloys
ZEN Connect Solution Bundle
Connect multiple perspectives of your samples across different imaging techniques and modalities
Often to fully understand your metal and alloys samples, you will need to combine multiple microscopy technologies or SEM modalities. This often includes time-consuming workflows to locate regions of interest for further imaging and analysis.
The ZEN Connect Solution Bundle allows you to connect multiple perspectives of your sample across scales and imaging modalities. ZEN connect Solution Bundle enables you to bring all imaging technologies together – ZEISS or not – to answer your research questions.
The advantages of ZEN Connect in multi-scale and multi-modal characterization workflows for metal and alloys
Easy navigation through the acquisition of low-magnification overview images
- Image your sample with any low magnification system and use to navigate to your regions of interest (ROIs).
- Understand your sample through images in context as you zoom in and out of datasets in the correlative workspace.
Overlay and align all your images to produce a contextual sample understanding
- Load or import any image data.
- Benefit from connecting complex multi-scale and multi-model data with simple overview data.
Manage your imaging project with Smart Data Management databases
- All data is saved in a project-based database for intuitive analysis.
- Search metadata to find images and their connected database.
Easy navigation with scientific context
ZEN Connect Correlation Solution Bundle
Increasing productivity and ease of use through correlative light and electron microscopy workflows
Once you have identified one region or location of interest using light microscopy, the natural workflow is to move the samples to the SEM to perform higher-resolution imaging or chemical analysis. The challenge and difficulty is relocating this specific region of interest once the sample has been transferred from light microscope to SEM.
Using the ZEN Connect Correlative Solution Bundle, this allows you to directly locate these regions of interest. This correlative workflow enables correlation of stage coordinates to provide a fast and efficient workflow to locate features between instruments.
The advantages of the ZEN Connect Correlation Bundle in improving workflow productivity and ease of use between multiple microscopes
Fast calibration for easy navigation
- Instead of wasting valuable time relocating regions of interest from microscope to microscope, you can now calibrate and navigate swiftly with only a few mouse clicks.
Correlative samples holder for precise relocations
- Semi-automatic 3-point calibration of reference markers allow for precise relocation to regions or features of interest.
- Create correlative data overlays to improve sample understanding and reporting.
ZEN Analyzer & Image Analysis Solution Bundle
Automated, high-throughput and repeatable image segmentation and analysis offline
To characterize metal and alloy samples, producing images is only part of the workflow. The imaging of microscopic features is critical in understanding its fundamental properties such as its mechanical properties and corrosion resistance.
The ZEN Analzer & Imager Analysis Bundle allows you to generate automatic measurements. Pre-defined measurement parameters and workflows enable fast and simple analysis using the offline analysis mode.
Benefit from automated and repeatable workflows
- By using the measurement program wizard, you can tackle complex measurement tasks in just a few minutes.
- Once created, the programs are always available and you can use them to analyze an unlimited number of images.
Take advantage of the full flexibility to define and control measurement process
- Retain full control over the measurement process and adjust the settings to your needs.
Automated report generation for improved productivity
- Use ZEN core´s powerful reporting functionality to create reports in MS Word or PDF format.
- Fully automate the reporting process with ZEN core’s Job Mode.
ZEISS EVO 10 & 25
EVO configurations designed to meet your imaging, analysis and budget requirements
ZEISS EVO 10
Base configuration
- The ZEISS EVO 10, with the base configuration offers a compact, robust and versatile imaging and analysis platform for routine materials characterization.
- This configuration extends performance, flexibility, and support beyond the limitations associated with tabletop SEMs.

ZEISS EVO 10
Smart configuration
- The EVO 10, with the smart configuration integrates SmartSEM Touch a easy to use, smart, intuitive and automated imaging and analysis capability.
- A Oxford Instruments Xplore 30 mm EDX with the AZtecLiveOne analysis software provides a chemical characterization workflow.

ZEISS EVO 10
SmartVP configuration
- The EVO 10, with the smartVP configuration provides a variable pressure capability to overcomes imaging challenges associated with charging samples.
- A range of variable pressure detector options, SmartSEM Touch for ease of use and a Oxford Instruments Xplore 30 mm EDX with the AZtecLiveOne provide a comprehensive range of capabilities.

ZEISS EVO 25
Smart configuration
- A high-performance industrial workhorse designed with a large chamber to accommodate large, bulky and heavy samples.
- This configuration combines the ability to inspect large samples while using the easy to use and automated capabilities of SmartSEM Touch. Oxford Instruments Xplore 30 mm EDX and AZtecLiveOne provide intuitive and productive chemical characterization workflows.
