ZEISS EVO Solution for New Materials

Industrialization and human development in the twentieth century was built upon steel, concrete and plastics, and was powered by coal, oil and gas. Now, Asia is leading the world in the next industrial revolution. We develop and produce new materials for energy and electronics, to electrify mobility and power, and help the world to communicate.
 
Only electron microscopy can provide a window into the nanometer world which underpins the next stage of industrial research, and is a now an essential tool for researchers and routine analysts. Defects that cause failure of batteries and components may be very small, so finding the region of interest has to be fast, and the images you can create must be both exceptional and easy to obtain, to understand the performance and failure of New Materials. Choosing the right instrument, configuration and capability, and training users of all skill and experience levels, has always been tricky. Multiple use instruments require flexibility, analytical capability, excellent productivity, reliability and stability, and high imaging performance is essential.
 
ZEISS EVO is the materials researchers’ stable, intuitive, uncompromising Scanning Electron Microscope (SEM) for research and routine applications. It is easy to buy, easy to train and easy to use. For New Materials applications we have created “Solution Bundles” designed for customer workflows in new energy and electronic and structural materials. They combine our comprehensive multi-scale, multi-modal ZEN software ecosystem, with its suite of connected automation and image analysis tools, with our versatile EVO 10 and EVO 25 platforms for easy productivity and insight. The benefit to our customers is a powerful, productive and easy SEM solution designed specifically for all your imaging and analysis needs.

ZEN Image Analysis Solution Bundle

Automated, high-throughput and repeatable image segmentation and analysis

To characterize New Materials, producing images is only part of the workflow. The imaging of microscope features is critical in understand a materials fundamental properties. However to characterize these new materials, imaging is only part of the workflow.

The ZEN Imager Analysis bundle allows you to generate automatic measurements. Pre-defined measurement parameters and workflows enable fast and simple analysis using the online analysis mode.

The advantages of the ZEN Image Analysis bundle to improve automation and repeatability of image segmentation and analysis workflows

 

Benefit from automated and repeatable workflows

  • By using the measurement program wizard, you can tackle complex measurement tasks in just a few minutes.
  • Once created, the programs are always available and you can use them to analyze an unlimited number of images. 

Take advantage of the full flexibility to define and control measurement process

  • Retain full control over the measurement process and adjust the settings to your needs. 

Automated report generation for improved productivity

  • Use ZEN core´s powerful reporting functionality to create reports in MS Word or PDF format.
  • Fully automate the reporting process with ZEN core’s Job Mode.
     

Application in Focus – Additive Manufacturing

  • Additive manufacturing is a powder based process; the components are built up by CAD operated, layer-by layer melting of the powder.
  • Amongst other things, the properties of the tools produced in this way depend on the powder characteristics and microscopic methods are an adequate means of determining them.
  • Image analysis allows the rapid quantification of the powders size distribution and statistical information.
  • This fast and repeatable quantification of results help to increase the efficiency of analysis.
     
Automatic segmentation of the brighter phase corresponding to particles
Automatic generation of reports and statistical analysis

ZEN Intellesis Image Analysis Solution Bundle

Using the power of machine learning for image segmentation and analysis

Image segmentation is the foundation of all image analysis steps. Image segmentation is one of the biggest challenges in microscopy when characterizing new materials. Compromising on your image segmentation, also means a compromise in the reliability of the analysis and subsequent results generated.

The ZEN Intellesis Image Analysis bundle enables you to enhance your segmentations of complex samples with machine learning driven segmentation. Machine learning supported image segmentation utilizes deep learning techniques to overcome limitations and challenges of threshold based segmentation techniques to improve analysis productivity, reliability and repeatability.

The advantages of ZEN Intellesis Image Analysis bundle to enhance your segmentation of complex samples

Machine Learning image segmentation module

  • More powerful than classical threshold based segmentation through combining a variety of different filters (e.g. intensity, edge detection, texture)

Simple and easy-to-use user interface for improved time-to-results

  • Straightforward, ease-to-use workflow that enables every microscope user to perform advanced segmentation tasks rapidly

Segment data from any imaging source

  • ZEN Intellesis can be used on image files from any imaging solution provider to provide a seamless segmentation workflow

Application area in Focus - Ceramics

  • In the research of ceramic samples, proper control of the grain, pores and precipitates distribution play a crucial role in optimizing the material properties.
  • The original SEM image is manually labelled for training of a model in ZEISS ZEN Intellesis.
  • 4 labels are used in the training to differentiate grains, grain boundaries, pores and precipitates.
  • The trained model can be reused on the same kind of images for automatic segmentation with ZEN Image Analysis module.
  • The resulting analysis model is more powerful than classical threshold based segmentation.
Effortlessly label and train the different objects in the ZEN Intellesis interface
Full integration in Image analysis module allows job mode and automation tools
Same image segmented using traditional threshold methods giving poor segmentation due to similar greyscale value for different constituents

ZEN Connect Solution Bundle

Connect multiple perspectives of your samples across different imaging techniques and modalities

Often to fully understand your New Materials samples, you will need to combine multiple microscopy technologies or SEM modalities. This often includes time-consuming workflows to locate regions of interest for further imaging and analysis.

The ZEN Connect Solution bundle allows you to connect multiple perspectives of your sample across scales and imaging modalities. ZEN connect Solution bundle enables you to bring all imaging technologies together – ZEISS or not – to answer your research questions.

The advantages of ZEN Connect in multi-scale and multi-modal characterization workflows of New Materials samples
 
Easy navigation through the acquisition of low-magnification overview images

  • Image your sample with any low magnification system and use to navigate to your regions of interest (ROIs).
  • Understand your sample through images in context as you zoom in and out of datasets in the correlative workspace
Overlay and Align all your images to produce a contextual sample understanding
  • Load or import any image data:
  • Benefit from connecting complex multi-scale and multi-model data with simple overview data
Manage your imaging project with Smart Data Management databases
  • All data is saved in a project-based database for intuitive analysis.
  • Search metadata to find images and their connected database

Application area in Focus - Magnetic Materials
  • Permanent magnet research is important for the future of e-mobility. Especially it´s performance in e-motors shall be improved.
  • First an overview scan was taken to be able to understand the composite formations and for example average particle size.
  • Then Kerr Microscopy in a light microscope was then used in interesting regions to qualify the magnetic performance which can be classified by looking at magnetic domains, determining promising magnetic phases.
  • In the third step high resolution images were taken with an electron microscope. The customer was in that case interested in correlations between pores, non-magnetic phases and domain structures. In some cases this study is also extended to EDX measurements to evaluate the composition of promising magnetic phase.
  • ZEN Connect enables scientist to analyze their data in a wider context connecting large field of view images with best possible resolution images.
     
Step 1. Use your favorite low magnification system to acquire large fields of view
Step 2. ZEN Connect organizes your images in a well-defined project.
Step 3. Align your high-resolution system to the overview image.
Step 4. Use the overview image to navigate and observe your high-resolution data in context

ZEN Connect Correlation Solution Bundle

Increasing productivity and ease of use in your light-to-electron microscopy workflow

Once you have identified one region or location of interest using light microscopy, the natural workflow is to move the samples to the SEM to perform higher-resolution imaging or chemical analysis. The challenge and difficulty is relocating this specific region of interest once the sample has been transferred from light microscope to SEM.

Using the ZEN Connect Correlation Solution Bundle, this allows you to directly locate these regions of interest. This correlative workflow enables correlation of stage co-ordinates to provide a fast and efficient workflow to locate features between instruments.
 

The advantages of the ZEN Connect Correlation Solution Bundle in improving workflow productivity and ease of use between multiple microscopes 

Fast calibration for easy navigation

  • Instead of wasting valuable time relocating regions of interest from microscope-to- microscope, you can now calibrate and navigate swiftly with only a few mouse clicks

Correlative samples holder for precise relocations

  • Semi-automatic 3-point calibration of reference markers allow for precise relocation to regions or features of interest
  • Create correlative data overlays to improve sample understanding and reporting
     

Application area in Focus - Additive Manufacturing

  • The layer by layer build up process in additive manufacturing allows a new flexible design of components.
  • This 3D printed sample was analyzed with various methods to be able to understand possible defects.
  • A large region was captured in the light microscopy to check the overall quality concerning pores and geometry and precipitates.
  • A polarized light images helped to understanding the laser scribe morphology and it´s correlation to defect locations
  • ZEN Connect Correlation Solution Bundle facilitates easy recovery of defects in 3D printed materials on an electron microscope after detection in the light microscope.
  • Correlation of LM and EM image allows to draw conclusions to the production process.
     
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Automatic calibration of correlative specimen holder, followed by image acquisition and marking of region of interest using motorized light microscope
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Loading the correlative specimen holder into electron microscope for automatic calibration
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Automatic relocation to precipitate, followed by high resolution image acquisition and overlay over large field of view light microscope image

Correlative Microscopy Solution Bundle

Start your Connected Microscopy processes with a stereomicroscope and EVO workflow

Often to fully understand your New Materials samples, you will need to combine light and electron microscopy images. This often includes time-consuming workflows to locate regions of interest for further imaging and analysis. 

Correlative Microscopy Solution Bundle allows you to capture a large field of view stereomicroscope image of your sample under various illumination methods and connect it to the high resolution SEM images for easier navigation and contextual understanding.

The advantages of the ZEN Correlative Microscopy bundle is in multi-scale and multi-modal characterization workflows of New Materials samples, by starting off with a large overview stereomicroscope image.

Easy navigation through the acquisition of low-magnification overview images

  • Image your sample with ZEISS Stemi 305 stereo microscope, capture large fields of view and quickly navigate to your regions of interest (ROIs). 
  • Understand your sample through images in context as you zoom in and out of datasets in the correlative workspace
  • Optimal illumination through reflected light contrasts and transmitted light ​& capture images with Zeiss Axiocam 105 color

Overlay and Align all your images to produce a contextual sample understanding

  • Load or import any image data to provide contextual sample understanding
  • Benefit from connecting complex multi-scale and multi-model data with simple overview data

Manage your imaging project with Smart Data Management databases

  • All data is saved in a project-based database for intuitive analysis.
    Search metadata to find images and their connected database
     

Application area in focus - Magnetic Materials

  • Permanent magnet research is important for the future of e-mobility. Especially it´s performance in e-motors shall be improved.
  • Macrostructure and defects might be present in permanent magnets that require stereomicroscopy observation. Correlating the overview structure of the permanent magnet to its microstructure at um and nm scale can be made easier by acquiring an overview image from Stemi 305 in the first step of ZEN connect workflow.
Step 1: Acquire large fields of view images using stereomicroscope
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Step 2: Acquire high resolution images using SEM
Step 3: Use the overview image to navigate and observe your high resolution data in context

Easy navigation with scientific context

ZEISS EVO 10 & 25

EVO configurations designed to meet your imaging, analysis and budget requirements

ZEISS EVO 10

Base configuration

  • The ZEISS EVO 10, with the base configuration offers a compact, robust and versatile imaging and analysis platform for routine materials characterization.
  • This configuration extends performance, flexibility, and support beyond the limitations associated with tabletop SEMs.

ZEISS EVO 10

Smart configuration

  • The EVO 10, with the smart configuration integrates SmartSEM Touch a easy to use, smart, intuitive and automated imaging and analysis capability.
  • A Oxford Instruments Xplore 30 mm EDX with the AZtecLiveOne analysis software provides a chemical characterization workflow.
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ZEISS EVO 10

SmartVP configuration

  • The EVO 10, with the smartVP configuration provides a variable pressure capability to overcomes imaging challenges associated with charging samples.
  • A range of variable pressure detector options, SmartSEM Touch for ease of use and a Oxford Instruments Xplore 30 mm EDX with the AZtecLiveOne provide a comprehensive range of capabilities.
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ZEISS EVO 25

Smart configuration

  • A high-performance industrial workhorse designed with a large chamber to accommodate large, bulky and heavy samples.
  • This configuration combines the ability to inspect large samples while using the easy to use and automated capabilities of SmartSEM Touch. Oxford Instruments Xplore 30 mm EDX and AZtecLiveOne provide intuitive and productive chemical characterization workflows.
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