EPTC Meet the Experts Session

ZEISS presented on the topic of “Developments in Advanced Packaging Failure Analysis using Correlated X-Ray Microscopy and LaserFIB” at EPTC.

We are hosting an online “Meet The Experts” session and we will be discussing the following topics –

1. Solutions for Package Failure Analysis and Development

2. Correlative X-Ray Microscopy to FIB-SEM workflows

You are cordially invited to participate in this session and engage with our experts and get any questions you need clarified. 

We look forward to seeing you at the session!

Experts in the session

Dr. Vignesh Viswanathan

Business Development Manager, Electronics, Asia Pacific
ZEISS Microscopy

Ms Yang Yanjing

X-Ray Microscopes Specialist, Asia Pacific
ZEISS Microscopy

Register your interest for a product demo!

Our team will get in touch with you