High Contrast, Submicron Resolution 3D X-ray Microscopy
Free Poster
Download the free digital poster and get a clear overview of high contrast, submicron resolution 3D X-ray microscopy. Let it guide you to understand the Versa Resolution at a Distance (RaaD).
![Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).]({"small":"https://images.zeiss.com/Microscopy/sg/2022/apac/versa_poster.ts-1634873368973.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=f05be470df8e9644a94b9af1446f84ef","large":"https://images.zeiss.com/Microscopy/sg/2022/apac/versa_poster.ts-1634873368973.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=e519b4f7472260b518f0cf4bd3084430","medium":"https://images.zeiss.com/Microscopy/sg/2022/apac/versa_poster.ts-1634873368973.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=d645cfa0fbb8cec4afd06830b8c3fdd3","full":"https://images.zeiss.com/Microscopy/sg/2022/apac/versa_poster.ts-1634873368973.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=f481ee2823c945e18592266d4913683a"} "Get a clear overview of the principle of focused ion beam scanning electron microscopy (FIB-SEM).")