ZEISS Microscopy

Latest Gemini Technology for Ultimate Microscopic Characterization of Challenging Samples

Webinar with Live Q&A

Latest Gemini Technology for Ultimate Microscopic Characterization of Challenging Samples

Across the globe, scientists are finding increasing applications for microscopic characterization using field emission scanning electron microscopes (FE-SEM), especially in line with current research trends within the various sectors such as nanotechnology, miniaturization of devices, life sciences, as well as in designing and discovery of novel materials.

In this SelectScience webinar, microscopy expert Dr. Ben Tordoff will highlight how the industry-leading Gemini technology was pioneered, the latest ZEISS FE-SEM portfolio, and its benefits for ultimate microscopic characterizations of challenging samples.


Key Learnings

  • Benefits of the advanced Gemini technology
  • The new ZEISS FE-SEM portfolio
  • Examples of challenging applications: e.g. low-kV imaging and chemical mapping, imaging of magnetic domains, electron channelling contrast imaging (ECCI), 3D STEM for high resolution tomography

Dr. Ben Tordoff

Head of Materials Science
ZEISS Research Microscopy Solutions

Dr. Mario Hentschel

Head of Nano and Microstructuring Activities
University of Stuttgart

Mr Cameron Smith

Editorial Team
SelectScience

Dr. Chung Chuan Wei

Product and Applications Sales Specialist
ZEISS Research Microscopy Solutions, APAC

22nd April 2021

  • 11:30 AM IST
  • 2:00 PM SGT 
  • 5:00 PM AEST

Register Here