Join us at 60 nm

Experience a revolution of structured illumination microscopy: SIM². Hear from our experts about challenges they face due to the current limitations of existing technology, and how they can be solved through new innovations.

• Discriminate sub-organelle structures down to 60 nm without the need for special sample preparation or expert knowledge of complex techniques

• Capture highly dynamic processes at exceptional resolution in all three dimensions

• Get outstanding out-of-focus light suppression for the sharpest sectioning in wide-field microscopy

• Make super-resolution acquisition faster than ever before