Contrast Beyond Resolution Online Seminar On-Demand

ZEISS FE SEM Technology

GeminiSEM 500 FE-SEM

Contrast Beyond Resolution Online Seminar

4 Tech Talks

Studying nanomaterials and samples in their pristine nature, especially beam-sensitive materials, necessitates low voltage imaging. Under these conditions, understanding the electric, magnetic and microstructural crystalline properties at the nanoscale are highly desired beyond the conventional analysis such as morphology, topography and atomic/elemental contrast in electron microscopes.
 
Developments in Field Emission Scanning Electron Microscopes (FESEMs) have pushed frontiers of low voltage imaging to improve resolution and detection capabilities. In addition to delivering images at sub-nm resolution over the entire operating range, the information obtained using different contrast mechanisms allow researchers and users in seeing beyond high-resolution micrographs.
 
The Gemini column introduced by ZEISS around 27 years ago has been designed to provide optimal low voltage imaging and analytical performance with ease of use. As we see an increasing adoption of this architecture, it is beneficial to understand the advantages of this column, detectors and its “sweet spots” that provides several contrast mechanisms such as voltage contrast, type II magnetic contrast, channeling contrast and scanning transmission electron microscopy in SEM to enable several applications in studying engineering materials, electronic materials and nanomaterials.

This seminar focuses on moving beyond pure resolution considerations to the diversity of contrast mechanisms that empower today’s researchers.

Talk 1

Understanding imaging contrast “sweet spots” of the Gemini column

Speaker: Dr. Hao Hanfang, FE SEM Specialist, ZEISS

Talk 2 

Low-kV Scanning Electron Microscopy - Beyond Sample Topography
 
Speaker: Dr. Iwona Jóźwik,  Łukasiewicz Institute of Electronic Materials Technology

Talk 3

Imaging magnetic materials and nanoparticles: Understanding and using the advantages of the Gemini column

Speaker: Dr. Chuan Wei Chung, Electron Microscopy Application Specialist, ZEISS

Talk 4

New developments in FE SEM based STEM imaging with the latest 3D nanotomography advances

Speaker: Dr Vignesh Viswanathan, FE SEM Specialist, ZEISS

Register to watch the Contrast Beyond Resolution Online Seminar On-Demand now!