Contrast Beyond Resolution Online Seminar

ZEISS FE SEM Technology | 2nd December 2020, 7:00 AM SGT

.. Days .. Hours .. Minutes .. Seconds
.. Days .. Hours .. Minutes .. Seconds
GeminiSEM 500 FE-SEM

Contrast Beyond Resolution Online Seminar

4 Tech Talks

Studying nanomaterials and samples in their pristine nature, especially beam-sensitive materials, necessitates low voltage imaging. Under these conditions, understanding the electric, magnetic and microstructural crystalline properties at the nanoscale are highly desired beyond the conventional analysis such as morphology, topography and atomic/elemental contrast in electron microscopes.
 
Developments in Field Emission Scanning Electron Microscopes (FESEMs) have pushed frontiers of low voltage imaging to improve resolution and detection capabilities. In addition to delivering images at sub-nm resolution over the entire operating range, the information obtained using different contrast mechanisms allow researchers and users in seeing beyond high-resolution micrographs.
 
The Gemini column introduced by ZEISS around 27 years ago has been designed to provide optimal low voltage imaging and analytical performance with ease of use. As we see an increasing adoption of this architecture, it is beneficial to understand the advantages of this column, detectors and its “sweet spots” that provides several contrast mechanisms such as voltage contrast, type II magnetic contrast, channeling contrast and scanning transmission electron microscopy in SEM to enable several applications in studying engineering materials, electronic materials and nanomaterials.

This seminar focuses on moving beyond pure resolution considerations to the diversity of contrast mechanisms that empower today’s researchers.

Talk 1

Understanding imaging contrast “sweet spots” of the Gemini column

The GeminiSEM column technology was developed by ZEISS more than 20 years ago. By using in-column beam deceleration, it became possible to reach excellent resolution at low beam energy without immerse the sample in strong electric or magnetic field.
Such design also gave unique imaging contrast to its detectors.

In this talk we will take a detailed look into the various signal detection in GeminiSEM and how to optimize imaging conditions and explore novel contrast mechanism in SEM at the Sweet Spots. With various application examples, we show that tomography contrast, voltage contrast, channeling contrast, material contrast information can be obtained at appropriate conditions to enable comprehensive characterization of specimen.

Speaker: Dr. Hao Hanfang, FE SEM Specialist, ZEISS

Talk 2 

Low-kV Scanning Electron Microscopy - Beyond Sample Topography
 
In recent years, advances in low kV SEM imaging has opened up new capabilities and applications. The improvements in spatial resolution supplement the advantages of low kV imaging which includes the ability to see surface information from both topography and material contrast perspectives, image non-conductive and beam sensitive materials. In this talk Dr Iwona Jóźwik will describe and explain the principles of low kV imaging and highlight various contrast mechanisms to study III-V semiconductors and electronic materials.
 
 
The strong contrast mechanisms observed with the Gemini column provide clear ability to distinguish dopants (p or n type) and density variations in III-V semiconductor devices and quantum wells. In addition, several insights in identifying and understanding artefacts and damage from different sample preparation methods are also presented.
 
Speaker: Dr. Iwona Jóźwik,  Łukasiewicz Institute of Electronic Materials Technology

Talk 3

Imaging magnetic materials and nanoparticles: Understanding and using the advantages of the Gemini column

Can a Scanning Electron Microscope (SEM) image magnetic material?” This is a common question asked and there are legitimate concerns when trying to put magnetic samples in an SEM (i.e. magnetic distortion, damage to the final lens).

In this webinar we will answer these questions in detail: We will introduce the advantages of the ZEISS Gemini column for imaging these materials. Through using several application examples, we will highlight the correct methods to images magnetic and nanoparticles that will allow you to get the most out of your SEM.

Speaker: Dr. Chuan Wei Chung, Electron Microscopy Application Specialist, ZEISS

Talk 4

New developments in FE SEM based STEM imaging with the latest 3D nanotomography advances

Transmission Electron Microscopy (TEM) is an imaging technique that provides atomic level imaging and is typically reserved for TEM dedicated instruments. In this talk we will outline the contrast mechanisms in transmission imaging and highlight the advantages of an annular STEM detector. STEM in FESEMs is becoming an increasingly adopted technique for a wide variety of applications ranging from imaging nanomaterials, thin sections of biological specimens and diffraction studies and crystal orientation mapping at the nanoscale.

The final part of this talk will focus on 3D tomography enabled with a new STEM holder that allows to tilt the sample and how digital image correlation techniques and 3D reconstruction can provide 3D volume imaging at the nanoscale.

Speaker: Dr Vignesh Viswanathan, FE SEM Specialist, ZEISS

Register for Contrast Beyond Resolution Online Seminar

2nd December 2020 | 7:00 AM SGT