Image courtesies: Rat Heart: University of Radboud, Netherlands; Pig eye: R. Williams, B. Geraghty, V. Kearns, V. Pied & J. Behnsen, University of Liverpool; Mouse bone: D. Wescott, University of Texas at San Marcos; Mouse embryo: Massachusetts General Hospital; Zebrafish: Animation from S. Suniaga, et al. (2018) https://doi.org/10.1038/s41598-018-21776-1

ZEISS at ICMAT

Welcome to the ZEISS booth at ICMAT 2023! Discover the future of materials analysis with our flagship product, the ZEISS Sample-in-Volume Analysis Workflow. This cutting-edge solution revolutionizes research by enabling precise analysis of materials at a microscopic level. Gain unparalleled insights into sample structures and properties. Speak with our experts, grab brochures, and explore our website to download collateral. Unlock the potential of materials science with ZEISS.
  • Identify, Access, Prepare, Analyze Your Sample with Precise Navigational Guidance

    ZEISS Sample-in-Volume Analysis Workflow

    651 KB
  • ZEISS Crossbeam laser FIB-SEM

    Discover Insights inside Advanced Semiconductor Packages

    1 MB


FIB-SEM for High Throughput 3D Analysis and Sample Preparation​

ZEISS Crossbeam Laser

Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.

Download your brochures now!

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