ZEISS Sigma​

ZEISS Sigma​ Experience High Quality Imaging & Total Sample Flexibility

We design the ZEISS Sigma for versatility. You analyze biological tissues, materials science samples, and complex specimens with confidence. With the ZEISS Sigma, you handle a wide range of samples without limitations. Want to streamline your research? Choose the tool that adapts to your needs. See your discoveries come to life.


Three reasons why ZEISS Sigma enables high-quality imaging & total sample flexibility:

  • Proven, Reliable Gemini Technology
  • Improved Signal-to-Noise Ratio with NanoVP lite Mode
  • Versatile platform makes it ideal for many accessories

Gemini Technology

  • The delicate open structure of a radiolarian is imaged effortlessly by the ETSE detector at 1 kV under high vacuum , image width 183 µm.
  • Mushroom spores imaged at 1 kV at high vacuum. These delicate, fragile structures can be imaged easily with Sigma 500 at low voltage.
  • Tricellaria inopinata
  • 3D brain ultrastructure using serial block-face imaging
  • The delicate open structure of a radiolarian is imaged effortlessly by the ETSE detector at 1 kV under high vacuum , image width 183 µm.

    The delicate open structure of a radiolarian is imaged effortlessly by the ETSE detector at 1 kV under high vacuum , image width 183 µm.

  • Mushroom spores imaged at 1 kV at high vacuum. These delicate, fragile structures can be imaged easily with Sigma 500 at low voltage.
    Mushroom spores imaged at 1 kV at high vacuum. These delicate, fragile structures can be imaged easily with Sigma 500 at low voltage.

    FeO sphere formed on flat steel surface imaged with ZEISS Sigma 300 with SE detector.

    Image featured in ZEISS User Story: "Microscopy Steel Analyses at Turkey's Largest Galvanized Steel Producer" published Spring 2022.

    FeO sphere formed on flat steel surface imaged with ZEISS Sigma 300 with SE detector.

    Image featured in ZEISS User Story: "Microscopy Steel Analyses at Turkey's Largest Galvanized Steel Producer" published Spring 2022.

  • Tricellaria inopinata
    Tricellaria inopinata
    Courtesy of V. Brune and S. Mathur, Institute of Inorganic Chemistry, University of Cologne, Germany.

    MSC capsules (hollow mesoporous silica) for drug delivery. Inlens SE detector at 500 V, field of view 1075 µm.

    Courtesy of V. Brune and S. Mathur, Institute of Inorganic Chemistry, University of Cologne, Germany.

    MSC capsules (hollow mesoporous silica) for drug delivery. Inlens SE detector at 500 V, field of view 1075 µm.

  • 3D brain ultrastructure using serial block-face imaging
    3D brain ultrastructure using serial block-face imaging

    Al2O3 spheres. Terraces of sintered particles are visible under surface-sensitive imaging with high resolution at 500 V. Some distances between terraces are as small as 3 nm, field of view 893 nm. Sigma 560, 500V, Inlens SE.
     

    Al2O3 spheres. Terraces of sintered particles are visible under surface-sensitive imaging with high resolution at 500 V. Some distances between terraces are as small as 3 nm, field of view 893 nm. Sigma 560, 500V, Inlens SE.
     

  • Titanium alloy (Ti-6Al-4V) powder for additive manufacturing or thermal spraying. Backscattered electron imaging (BSE), SIGMA 300

See the Difference at 1 kV and Below

Enhanced Resolution. Optimized Contrast

  • The optical column is key to performance in imaging and analytics. Sigma operates with ZEISS Gemini 1 electron optics which provide excellent resolution on any sample, especially at low voltages.
  • Low-kV resolution for Sigma 360 is now specified at 500 V with 1.9 nm. An improvement in 1 kV resolution of more than 10%—at 1.3 nm—has been achieved by minimizing chromatic aberrations.
  • Imaging is now easier than ever before, even on challenging samples, even with backscatter detection in variable pressure (VP) mode.

NanoVP lite Mode

  • The delicate open structure of a radiolarian is imaged effortlessly by the ETSE detector at 1 kV under high vacuum , image width 183 µm.
  • Mushroom spores imaged at 1 kV at high vacuum. These delicate, fragile structures can be imaged easily with Sigma 500 at low voltage.
  • Tricellaria inopinata
  • 3D brain ultrastructure using serial block-face imaging
  • The delicate open structure of a radiolarian is imaged effortlessly by the ETSE detector at 1 kV under high vacuum , image width 183 µm.

    The delicate open structure of a radiolarian is imaged effortlessly by the ETSE detector at 1 kV under high vacuum , image width 183 µm.

    NanoVP lite modes, gas distribution (pink), electron beam skirting (green).

  • Mushroom spores imaged at 1 kV at high vacuum. These delicate, fragile structures can be imaged easily with Sigma 500 at low voltage.
    Mushroom spores imaged at 1 kV at high vacuum. These delicate, fragile structures can be imaged easily with Sigma 500 at low voltage.
    Michael D. Blanton, The University of Southern Mississippi, School of Polymers and High Performance Materials

    FE-SEM image, SIGMA VP, Secondary electrons, 1kV
    Recrystallized nanoparticles forming micron-scale cube

    Michael D. Blanton, The University of Southern Mississippi, School of Polymers and High Performance Materials

    FE-SEM image, SIGMA VP, Secondary electrons, 1kV
    Recrystallized nanoparticles forming micron-scale cube

  • Tricellaria inopinata
    Tricellaria inopinata
    Michael D. Blanton, The University of Southern Mississippi, School of Polymers and High Performance Materials

    FE-SEM image of glass spheres, InLens and Secondary Electron image (mixed), 1kV, SIGMA VP

    Michael D. Blanton, The University of Southern Mississippi, School of Polymers and High Performance Materials

    FE-SEM image of glass spheres, InLens and Secondary Electron image (mixed), 1kV, SIGMA VP

  • 3D brain ultrastructure using serial block-face imaging
    3D brain ultrastructure using serial block-face imaging

    Cascade Current Detector that creates an ionization cascade and measures the resulting current. This provides crisp images in VP mode, even at higher pressures and lower voltages.

    Cascade Current Detector that creates an ionization cascade and measures the resulting current. This provides crisp images in VP mode, even at higher pressures and lower voltages.

  • Cryo fixed and platinum coated forget me not flower pollen affixed to a petal. Imaged at 5kV accelerating voltage.

Optimise Signal-to-Noise Ratio and Improve Sample Flexibility

Leverage Advanced Low kV Performance for Superior Imaging and Precise Analytics

Work with the NanoVP lite mode for analytics and imaging. Benefit from better image quality especially at low kV and get analytical data faster and more precise.

  • In NanoVP lite the skirt effect and the beam gas path length (BGPL) are reduced. The reduced skirt leads to an enhanced signal-to-noise ratio in SE and BSE imaging.
  • The retractable aBSD with its five annular segments delivers excellent material contrast: it carries the beam sleeve and is fitted under the pole piece during NanoVP lite operation. It provides high throughput and low voltage compositional and topographical contrast imaging and is suitable for VP and HV (high vacuum).

Accessories

In Situ Lab for ZEISS FE-SEMs - Link Materials Performance to Microstructure

In Situ Lab for ZEISS FE-SEMs

Link Materials Performance to Microstructure

Extend your ZEISS FE-SEM with an in situ solution for heating and tensile experiments. Benefit from an integrated solution. Investigate materials like metals, alloys, polymers, plastics, composites, and ceramics. Combine a mechanical tensile or compression stage, a heating unit and dedicated high-temperature detectors with analytics. Control all system components from a single PC with a unified software environment that enables unattended automated materials testing.

SmartEDX - Discover Embedded Energy Dispersive X-ray Spectroscopy

SmartEDX

Discover Embedded Energy Dispersive X-ray Spectroscopy

If SEM imaging alone isn’t enough to gain a complete understanding of your samples turn to embedded EDS for microanalysis. Acquire spatially resolved elemental information with a solution optimized for low voltage applications. Optimize routine microanalysis and detection of low energy X-rays from light elements thanks to superior transmissivity of the silicon nitride window. Teams in multi-user environments will benefit from the workflow-guided GUI. The support of the ZEISS engineer offers you a one-stop-shop for installation, preventive maintenance and warranty.
Fully Integrated RISE - Benefit from Raman Imaging and Scanning Electron Microscopy

Fully Integrated RISE

Benefit from Raman Imaging and Scanning Electron Microscopy

Complement the characterization of your material and add Raman Spectroscopic Imaging (RISE). Get a chemical fingerprint from your sample and extend your Sigma 300 with confocal Raman imaging capability. Recognize molecular and crystallographic information. Perform 3D analysis and correlate SEM imaging, with Raman mapping and EDS data if appropriate. Fully integrated RISE lets you take advantage of both best-in-class SEM and Raman systems.

Contact us

Find out what Total Sample Flexibility means for your institute

One of our ZEISS experts will reach out and show you what total sample flexibility means for your institute.

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