For Material Scientists

Recent FE-SEM developments for material characterization: Combining Gemini optics and image processing

Register For A FREE ZEISS Webinar

Observing materials using a field emission scanning electron microscope (FE-SEM) has become essential for the development of materials. Production steps and even macroscopic properties are related to the microstructure of materials.

Therefore, microscopy is the tool of choice, enabling material researchers to link micro- and nanometer-scaled structures and macro-scaled properties. Advances in usability have made this technology approachable for any kind of user, no matter if they are a novice or expert.

In this webinar, we will show how the FE-SEM combines the latest hardware and software technology in the analysis and characterization of various materials. The examples shown will cover research trends in nanotechnology, miniaturization of devices, life sciences, and novel materials.

Your Presenters For Today

Dr. Fang Zhou

Fang Zhou is serving as a Manager Business Sector in Materials Science at ZEISS Research Microscopy Solutions. His main focuses currently are in situ microscopy, as well as multimodal and multiscale correlative microscopy. He joined ZEISS Microscopy as a product manager for field emission scanning electron microscopy in 2012. Prior to this he worked for Applied Materials, Inc. and the University of Tübingen. He holds a PhD in Applied Physics from the University of Tübingen, a M.S. degree from Chinese Academy of Sciences in Beijing and a B.S. degree from Zhejiang University in Hangzhou, China.

Dr. Markus Boese

Dr. Markus Boese is an Application Specialist for the Materials Science Marketing Team at ZEISS Microscopy, Oberkochen, Germany. He holds a PhD in Chemistry from the University of Bonn. For his postdoctoral research in electron microscopy, he joined several research facilities: Ernst Ruska Center (Juelich), Trinity College (Dublin), and the National Center of Electron Microscopy (Berkeley). His current activities at ZEISS are focusing on characterizing materials in various fields.

Click To Register For The FREE Webinar

ZEISS’s Recent FE-SEM developments for material characterization: Combining Gemini optics and image processing Webinar

Key learning objectives

Discover the benefits of using Gemini optics for materials analysis
Understand software-supported image analysis
Learn how to analyze charging materials with the new NanoVP lite mode
Explore examples of low kV imaging for challenging samples

Who should attend?

Materials scientists
Core facility managers of microscopy centers
Scientists or research professionals in materials science, semiconductor/electronics, life sciences, academia, government or industry, PhD students, and researchers who are interested in microscopic characterizations

ZEISS’s Recent FE-SEM developments for material characterization: Combining Gemini optics and image processing webinar

Register below to get access now

Form is loading...