Sample-in-Volume Analysis Workflow Webinar

Identify, Access, Prepare, Analyze your sample with precise navigational guidance

Solving The Multi-scale Microscopy Challenge

For Material Scientists

Do you struggle to...

• Identify deeply buried defects or samples in large volume?

• Precisely access Regions-of-Interest (ROI) within a volume for sample preparation such as TEM, APT or microanalysis samples?

• Establish multi-scale or multi-dimensional information ranging from macro- to sub-nanometer length scale?

Introducing ZEISS Sample-in-Volume Analysis workflow

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Who Is This Webinar For?

Working With Large Samples

If you are a material scientist, research engineer, microscopist or technologists who wants to learn about ZEISS multi-scale microscopy solutions, this webinar is for you.

Characterization of samples in material science requires an understanding of structures, processes and properties across different length scales. As we move from the macro-scale towards sub-nanometer, we need a workflow that enables us to make the best decisions possible for the best experimental outcomes by:

Helping to identify regions of interest in large samples
Provide a method to precisely access regions buried within our samples that contain the nm-scaled information required
A preparation step that allows us to create high-quality surfaces and structures for further analysis

The Sample-in-Volume Analysis Workflow

Identify, Access, Prepare, Analyze your sample with precise navigational guidance

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Here's What You'll Learn In The SamVol Webinar

ZEISS has developed a unique correlative workflow to address these multiscale challenges. This workflow is known as the Sample-in-Volume Analysis workflow and synergizes the latest innovations in multi-scale microscopy.

• The ZEISS multi-scale microscopy workflow that characterizes length scales from macro- to sub-nanometer

• How 3D non-destructive X-ray microscopy can help identify regions of interest for downstream experiments

• How the ZEISS Crossbeam platform with the integrated fs-laser provides a paradigm change for ion beam microcopy with the capability to achieve massive material ablation to access deeply buried structures

• How the Ion-sculptor provides high quality surfaces and structures for further experiments and analysis

• How the ZEISS Atlas 5 software can provide the correlative link to allow precise and site-specific access to regions of interest

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Video of the Sample-in-Volume Analysis workflow

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