Introducing ZEISS Sample-in-Volume Analysis workflow
Identify, Access, Prepare, Analyze your sample with precise navigational guidance
Understanding the multi-scale microscopy challenge
For Material ScientistsCharacterization of samples in material science requires an understanding of structures, processes and properties across different length scales. As we move from the macro-scale towards sub-nanometer, we need a workflow that enables us to make the best decisions possible for the best experimental outcomes by:
- Helping to identify regions of interest in large samples
- Provide a method to precisely access regions buried within our samples that contain the nm-scaled information required
- A preparation step that allows us to create high-quality surfaces and structures for further analysis
ZEISS has developed a unique correlative workflow to address these multiscale challenges. This workflow is known as the Sample-in-Volume Analysis workflow and synergizes the latest innovations in multi-scale microscopy.