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Introducing ZEISS Sample-in-Volume Analysis workflow

Identify, Access, Prepare, Analyze your sample with precise navigational guidance

Understanding the multi-scale microscopy challenge

For Material Scientists

Characterization of samples in material science requires an understanding of structures, processes and properties across different length scales. As we move from the macro-scale towards sub-nanometer, we need a workflow that enables us to make the best decisions possible for the best experimental outcomes by:

  • Helping to identify regions of interest in large samples
  • Provide a method to precisely access regions buried within our samples that contain the nm-scaled information required
  • A preparation step that allows us to create high-quality surfaces and structures for further analysis

ZEISS has developed a unique correlative workflow to address these multiscale challenges. This workflow is known as the Sample-in-Volume Analysis workflow and synergizes the latest innovations in multi-scale microscopy.

Download the product application brochure

The Sample-in-Volume Analysis Workflow

Identify, Access, Prepare, Analyze your sample with precise navigational guidance

Video of the Sample-in-Volume Analysis workflow

Identify

Your Sample-in-Volume with the Versa 3D X-ray Microscope (XRM)

The ZEISS Xradia Versa enables non-destructive 3D X-ray microscopy (XRM) for imaging of large samples. The synchrotron-like optics provide two distinctive advantages in addressing the multi-scale microscopy challenge:

  • Use Resolution at a Distance (RaaD) technology to maintain a high spatial resolution while imaging large sample volumes
  • Benefit from the Scout-and-Zoom capability to locate multiple regions of interest and perform higher resolution non-destructive “interior tomography” for region of interest identification

Download the brochure to learn more about the workflow and example applications in catalysts & nanoparticles, battery, metals & additive manufacturing, geoscience and electronics and device research.

Access

Your Sample-in-Volume with the LaserFIB for ZEISS Crossbeam

The LaserFIB for the ZEISS Crossbeam integrates a femtosecond laser onto the ZEISS Crossbeam (FIB-SEM) platform. The integrated laser enables massive and rapid material removal. This enables you to mill through large volumes and access the identified regions of interest buried deeply within your sample.

  • ZEISS ATLAS 5 allows you to correlate your XRM data for precise targeting of regions of interest for LaserFIB milling
  • Prepare large cross sections and trenches to access your deeply buried region of interest in minutes.
  • Protect your FIB-SEM from contamination by performing the laser milling in a dedicated and isolated load lock chamber

Download the brochure to learn more about the workflow and example applications in catalysts & nanoparticles, battery, metals & additive manufacturing, geoscience and electronics and device research.

Prepare

Your sample surface or structures for further analysis

The ZEISS Crossbeam with the Ion-sculptor Ga+ ion column can provide you with exceptional surfaces finishing to prepare delicate structures and high-quality surfaces.

  • Perform live imaging and milling to provide precise navigational guidance to the region of interest
  • Use the Ion-sculptors low voltage capabilities for fine polishing and the preparation of ultra-thin samples
  • Benefit from the 100 nA probe current to ensure fast and precise preparation without compromising on resolution

Download the brochure to learn more about the workflow and example applications in catalysts & nanoparticles, battery, metals & additive manufacturing, geoscience and electronics and device research.

Analyze

Your Prepared Sample

The ZEISS Crossbeam platform allows you to configure a range of analytical modalities on to the Crossbeam platform. Take the prepared sample to external instruments (i.e., TEM, APT) to extend the Sample-in-Volume Analysis to the sub-nanometer

  • Perform microanalysis using on your identified region of interest (i.e., EDX, EBSD)
  • Analyze trace elements with ToF-SIMS attached to the Crossbeam platform for a completely air free workflow
  • Benefit from ZEISS Atlas 5 for 3D FIB tomography, 3D EBSD and 3D EDS analysis capabilities

Download the brochure to learn more about the workflow and example applications in catalysts & nanoparticles, battery, metals & additive manufacturing, geoscience and electronics and device research.

Register below to download the product application brochure

Learn how Sample-in-Volume can help your research

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