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Correlative Microscopy for HDD Particle Analysis

In hard disk manufacturing, particles as small as 0.5 microns can trigger a catastrophic head crash.
When that happens, speed and certainty matter.

ZEISS correlative microscopy connects light microscopy and electron microscopy into one precise workflow, allowing engineers to move quickly from seeing a particle to knowing exactly what it is.

LINK TO FORM

The Real Bottleneck in HDD Failure Analysis

Finding particles on a filter is not the hard part.
Finding the same particle again under an SEM is.

In traditional workflows:

  • Particles are manually picked from filters
  • Transferred to SEM stubs
  • And then searched for again at high magnification

This “search and rescue” phase can take hours. It also risks losing the particle entirely.

When production is down, that delay is costly.

How Correlative Microscopy Solves This (THE FINAL IMAGES WILL BE TAKEN FROM THE ALS VIDEO)

ZEISS Axio Imager and ZEISS Sigma share a digital coordinate system that keeps the sample, and every region of interest, perfectly aligned across microscopes.

1. Fiducial registration

A dedicated ZEISS filter holder includes physical fiducial markers.
The operator registers these markers once, defining the filter’s exact position.

2. ROI mapping in light microscopy

As the filter is scanned with Axio Imager, suspect particles are flagged.
Each particle’s precise X/Y coordinates are recorded.

3. Coordinate transformation

When the same holder is placed into the Sigma SEM, the system recognizes the fiducials and aligns the coordinate systems automatically.

4. Automated navigation

The SEM stage drives directly to the exact particle location.
No searching. No guesswork.

The old way

  • Manual particle picking
  • Time spent hunting at high magnification
  • High risk of particle loss
  • Loss of spatial context

The ZEISS correlative workflow

  • Entire filter stays in one holder
  • Automated navigation to every ROI
  • Zero risk of losing particles
  • Light and SEM images can be overlaid for full context

See the Workflow in Action

Watch how ZEISS correlative microscopy streamlines particle analysis for hard disk applications.

  • HERE I WILL INSERT THE ALS VIDEO

Why This Is Critical for HDD Manufacturing

In failure analysis, time-to-result is everything.

(THE IMAGE ON THE RIGHT WILL BE RELEVANT IN THE FINAL VERSION)

Correlative microscopy helps HDD teams:

  • Identify contamination sources faster
  • Reduce analysis variability between operators
  • Preserve fragile particles
  • Get answers without rework or repetition

That means faster root cause identification and quicker decisions when yield and uptime are on the line.

Talk to a ZEISS Microscopy Expert

If particle-related failures are slowing your analysis or increasing risk, correlative microscopy can change that.
Speak with a ZEISS expert to see how Axio Imager and Sigma work together in your lab.

Request a Correlative Microscopy Demo

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Discover the products

  • ZEISS Axio Imager 2

    VersaXRM 730

    Fast, reliable screening for particle detection
    Axio Imager 2 provides high-quality light microscopy for rapid, large-area inspection. It is the first step in correlative workflows, enabling fast detection, counting, and documentation of critical particles on filters.

    • Large-area, high-throughput screening. Quickly scan entire filters to detect and flag suspect particles.
    • Accurate ROI definition. Precisely mark regions of interest for direct correlation with SEM.
    • Stable, repeatable imaging. Delivers consistent results for routine particle and failure analysis.
    See highlights

  • ZEISS SIGMA

    VersaXRM 615

    High-resolution SEM for confident material identification
    SIGMA delivers detailed surface imaging and elemental analysis to confirm particle composition and root cause. Integrated into correlative workflows, it removes the need for manual searching and sample rework.

    • High-resolution SEM imaging Resolve sub-micron particles critical to HDD reliability.
    • Integrated EDX analysis Identify particle chemistry directly at the region of interest.
    • Automated navigation to ROIs Go straight to the target location without time-consuming searching.
    See highlights

  • ZEISS Shuttle & Find

    Xradia Versa 515

    The link that makes correlation work
    Shuttle & Find connects light microscopy and SEM through a shared coordinate system. It ensures the exact same region of interest can be relocated automatically across instruments.

    • Exact ROI relocation across microscopes Maintains precise coordinates from light microscopy to SEM.
    • No manual particle handling Keeps samples intact and eliminates risk of loss or damage.
    • Faster, more consistent workflows Turns manual relocation into automated, repeatable navigation.
    See highlights