Add annotation for resolution and voltage settings
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GeminiSEM 560 image showing pinholes and grain boundaries in full detail
Add annotation for resolution and voltage settings
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Why It Matters to Seagate
Your Challenges
Detecting sub-surface defects in fragile magnetic films
Correlating data across XRM, FIB-SEM, and SEM
Pressure to shorten failure analysis timelines
Our Solution
Sub-nanometer resolution at low kV: Ideal for delamination, grain structure, pinholes
Inlens detection: Crisp surface and interface imaging
Fast acquisition + analytics: Keeps R&D moving
ZEN Connect + SmartSEM: Workflow continuity from macro to nanoscale
Designed for FA at Seagate Scale
Ultra/Supra
GeminiSEM 560
Resolution @ 1 kV
~1.3 nm
< 1.0 nm
Inlens Contrast
Basic
Advanced with dual detection
Workflow Integration
Manual
Automated with ZEN Connect
Upgrade Path
Limited
FIB/cryo ready
With GeminiSEM 560, we pinpointed root causes in half the time—no more chasing shadows through layers of noise.
Take the Next Step in Failure Analysis Excellence
Don’t just detect—understand. GeminiSEM 560 gives your team the power to spot hidden defects, validate root causes faster, and future-proof your R&D workflows.
[Request a personalized demo tailored to Seagate’s use cases]
[Download the 1-page summary for internal discussions]
[Talk to a ZEISS specialist about integration with your current tools]
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