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Why Scanning Electron Microscopy (SEM) is important to light microscopy-based research

Webinar | Monday, 13 April 2020 | 2.30 PM

Join us for a LIVE webinar

Title: "Why Scanning Electron Microscopy (SEM) is important to light microscopy-based research."

Save time and improve the efficiency of your experiments using intuitive, customisable and highly automated imaging workflows. Explore clever use of SEM’s through Correlative Microscopy and 3D Imaging to help you address multi-scale challenges.

Join us for a free English webinar "Why Scanning Electron Microscopy (SEM) is important to light microscopy-based research." held on 13 April 2020, from 2.30PM to 3.30PM to find out how state of the art SEM Imaging quality has dramatically caught up with TEMs in terms of resolution and contrast for thin section preparation of biological specimen.

In the 45-minute webinar, you will have a general introduction into Electron Microscopy (EM) for the Life Sciences, learn about state-of-the-art Correlative Light and EM workflows which are highly automated and efficient. Also, you will learn about the benefits of connected microscopy in your field. There will be a 15-minute Q&A session in the end for you to ask your questions.

Highlights of the webinar

  • Versatile use of SEM’s through Correlative Microscopy and 3D Imaging helping you to address your multi-scale challenges
  • Learn how state of the art SEM Imaging quality is dramatically caught up with regard to resolution and contrast to TEM for thin section preparation of biological specimens
  • Save time and improve the efficiency of your experiments using intuitive, customizable and highly automated imaging workflows

Who should attend
Life science researchers and microscope users who would like to keep up-to-date with current technologies.

Registration

The registration for this webinar has been closed. Thank you for attending.

Speaker

Dr. Philipp Bastians

Philipp Bastians | ZEISS

Dr. Philipp Bastians is a Product & Applications Specialist in Life Science Electron, X-Ray and Correlative Microscopy with ZEISS Research Microscopy Solutions, Asia Pacific. He graduated from the Max-Planck-Institute for Brain Research, Frankfurt am Main, Germany with a PhD on “Comparative Cortical Connectomics: Circuit Analysis Across Species and Cortex Types”. His work experience includes many years of serial block-face (3View, FIB) SEM, room- and cryo-temperature SEM, ultramicrotomy and MultiSEM imaging in the labs of Prof. Winfried Denk and Prof. Moritz Helmstaedter.