FE-SEM Workshop

December 14-16, 2022

Producing High-Quality Images with FE-SEM for Material Samples
Join our workshop & micrograph competition

In collaboration with

In collaboration with Universiti Kebangsaan Malaysia, we are excited to host an FE-SEM Workshop and Micrograph Competition.

Field Emission Scanning Electron Microscopy (FE-SEM) provides topographical and elemental information at magnifications of 10x to 300.000x, with virtually unlimited depth of field. Compared with conventional Scanning Electron Microscopy (SEM), FE-SEM produces clearer, less electrostatically distorted images with spatial resolution down to 1 1/2 nanometers, with is three to six times better.

Agenda

Wednesday, 14th December 2022

Day 1

09.00

Registration

09.30

Opening Ceremony

10.00

Academia Speaker

12.00

Lunch

14.00

Technical Speaker

15.30

Sharing Session

16.30

High-tea

Thursday, 15th & Friday, 16th December 2022

Day 2 & 3

Grouping | 5 people in 1 group, 3 groups per day

09.00

Practical Module

12.00

Lunch

14.00

Hands-on Session

17.00

High-tea

Micrograph Competition

Grand prizes for the winners

Details

Bring your own sample
The image must be coloured
One image per entry
Limited to 30 participants
Fee: RM250

All contestants will receive

  • Certificate
  • Free meals
  • Hands-on experience
  • Goodie bag
Prizes

1x VIVO X80 PRO with ZEISS optics
worth RM4,999

2x JBL headphones

Register for ZEISS On Your Campus

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