ZEISS On Your Campus (ZOYC) Online is comprised of free live online webinars with your local account team.
ZOYC Online has three main goals:
1. Provide education focused on better utilisation of your current microscopy equipment, which can lead to:
- Higher quality imaging and faster time to results
- A better understanding of the data that are collected
- Improved experimental design
2. Bring awareness of new and emerging microscopy trends and technologies.
3. Connect live with your local ZEISS account team.
Samuel Ko, BSc (Hons.), MPhil., PhD
Head of Product and Application Sales Specialist
Dr Samuel Ko studied Biochemistry in Hong Kong with a particular focus on the cellular response of tumour necrosis factor-alpha-induced apoptosis in mouse fibroblast cell line L929 during his MPhil and PhD research, by using fluorescent imaging techniques such as Confocal Laser Scanning Microscopy (CLSM). He received his PhD from The Chinese University of Hong Kong in 2001. From 2001 to 2005, he worked as a post-doctoral fellow at Department of Surgery, University of Hong Kong, where he investigated carcinogenesis of gastric adenocarcinoma. Since August 2005, Samuel joins Carl Zeiss Singapore as a regional application specialist. He is mainly in charge of the products of CLSM, SuperResolution Microscopy, Lightsheet Fluorescence Microscopy (LSFM) and PALM MicroBeam LCM (Laser Capture Microdissection).
Advances in 3D additive manufacturing techniques have enabled the production of nanostructures with remarkable mechanical properties. Using the latest 3D-printing techniques, novel material structures with unique mechanical properties can be produced, such as micro- and nanolattices. Understanding the underlying characteristics of these complex new materials, such as deformation mechanisms, and how they impact structural behaviour, is increasingly challenging. In this webinar, you will be presented with examples of how various microscopy techniques, including scanning electron microscopy (SEM), helium ion microscopy (HIM), and nanoscale X-ray imaging, have been applied to the study of nanoarchitectured lattice structures. You will also learn how these techniques have helped to solve some of the most intriguing questions related to nanomaterials.
- Learn about how scanning electron microscopy (SEM), helium ion microscopy (HIM), and nanoscale X-ray imaging, can be applied to the study of nanoarchitectured lattice structures
- Understand how these techniques help solve some of the intriguing questions pertaining to nanomaterials, especially related to the new and emerging field of 3D printing at nanoscale
The LaserFIB combines an ultra-short pulsed laser, typically a femtosecond (fs) laser, and a FIB-SEM, all in one microscope. Massive material ablation by the laser allows to gain rapid access to structures buried deeply in, e.g. packaged electronics or display devices. FIB-SEM can then analyze the targeted regions of interest. Remarkably, sample damage or heat effects induced by the laser are minimal. Thus, the LaserFIB is attracting attention also in the field of materials engineering and characterization, e.g. for the fabrication of micromechanical testing devices with dimensions of up to millimetres or large cross-sections for EBSD.
As a leading supplier of electron and ion-optical systems, ZEISS offers state of the art Secondary Ion Mass Spectroscopy (SIMS) technology for compositional and Isotopic analysis. The webinar will give an overview of the high-end SIMS technology and its potential application space.
In this work, we fabricated and characterized nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules using FIB-SEM.
Direct FIB nanopatterning of silicon master stamps allows fast prototyping of nanochannels of different shapes, cross-sections and depths. Moreover, the fabrication of 3D structures, such as funnel-shaped inlets to connect the nanochannels to the much deeper and wider microchannels, is straightforward. This is essential to ensure an optimal DNA flow in the fluidic chip. Using UV nanoimprinting the pattern on the silicon master stamp is transferred to a polymer-on-glass stamp, which is used as a stamp in a second UV nanoimprint step, to create the actual chip.
In the FIB-SEM, not only the master stamps can be machined, but the entire fabrication process can be monitored in a non-destructive way. ZEISS unique local charge compensation enables high-resolution SEM characterization of the highly insulating polymer-on-glass stamps and devices without any metal coating, allowing us to use the devices after their inspection.
Can a scanning electron microscope image magnetic material?” This is a common question asked by many people. There are legitimate concerns when trying to put magnetic samples in an SEM: will the magnetic field from the sample disturb the imaging? Will the sample be attracted into the lens and damage the SEM? In this webinar, these questions will be discussed in detail. Several examples will be given to highlight the correct method to image magnetic materials. In the end, a special contrast mechanism to image magnetic domains in SEM will also be explored.