ZEISS Microscopy

Webinar: High Throughput Lab Based Non-Destructive 3D Grain Mapping

Crystallographic Insights into Materials Science Samples

In polycrystalline materials, determining the grain characteristics such as the three-dimensional orientation, morphology, and size is extremely important since these dictate the mechanical, thermal, electrical and optical properties of the materials. By fine-tuning the grain properties, remarkable material properties, and performance enhancements can be achieved. Traditional grain mapping techniques such as electron backscattered diffraction (EBSD) or polarization light microscopy provide excellent high-resolution images in 2D. For sub-surface crystallographic information, these techniques are combined with serial sectioning using either mechanical polishing or more precise focused ion beam polishing. However, both of these techniques are destructive in nature.

Alternatively, non-destructive grain mapping is made possible by the penetrating power of X-rays and was previously only possible at a select few synchrotrons around the world. With the advances in X-ray sources, detector technology and supporting computational grain analysis software, lab-based X-ray microscopy can now be extended to map grains in 3D based on the Diffraction Contrast Tomography approach.

This webinar gives you the technology overview of LabDCT, Laboratory Diffraction Contrast Tomography, enabling grain mapping in your home lab. We will cover the basic working principle of LabDCT and present numerous applications examples covering a wide variety of materials ranging from highly symmetric cubic materials to some of the low symmetry materials that were previously challenging to investigate. We will also introduce a recently introduced rapid high throughput 2D grain mapping workflow developed by combining a femtosecond laser module with a Focused Ion Beam instrument to enable quick access to deeply buried microstructural features and grains. Finally, we present numerous examples and discuss how the two complementary techniques can be combined to get valuable insights into the material microstructure.

Date: Tuesday, September 29, 2020 2:30 PM - 3:30 PM SGT
Speaker: Hrishikesh Bale (ZEISS)

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