Electron backscatter diffraction (EBSD) is a powerful tool in providing the metals researcher with crystallographic information of the grains and precipitates in metal alloys, so critical in determining the performance and durability of a metal in service. The focused ion beam scanning electron microscope (FIB-SEM) allows three-dimensional imaging of the tiniest features, and ion milling is a fine operation capable of generating surfaces able to be analyzed by EBSD. The ZEISS Crossbeam Laser can rapidly ablate material from samples to access deeply buried features, and this webinar explains how recent research has determined how surfaces can now be prepared through laser ablation alone and analyzed by EBSD without the need for time-consuming fine polishing. This technique enables rapid analysis of deeply buried features in streamlined workflows.
Date: Thursday, July 9, 2020 2:30 PM - 3:30 PM SGT
Speaker: Andy Holwell (ZEISS)