ZEISS Microscopy


3D SEM – Large Volume Electron Microscopy Enabling Statistical Analysis

Electron microscopy imaging has been used as a valuable research tool in the Life Sciences for many years. From the research of single-cell organisms, viruses or eukaryotic cells to the identification of synaptic contacts between neurons, the ability to image biological samples in nanometer resolution has proven to be extremely valuable for many areas of biological research. The majority of these examples has been studied using the well-established Transmission Electron Microscopy (TEM) technique which requires thin preparations and limits the third dimension in scale and resolution in x, y and z.

Recent developments in Scanning Electron Microscopy (SEM) opens the spectrum of high resolution and high volume imaging of biological tissue. SEM enables extensive automation and dramatic resolution improvements in the third dimension above what is possible with TEM, using at least three different SEM methods, Focused Ion Beam (FIB), block-face cutting techniques and serial section imaging. Also, SEM offers a large field of view imaging and opens up applications that have previously been unachievable in the lab.

This talk explains the strength and limitations of each of the techniques to help guide you in choosing the best solution for your applications. It also introduces some recent advancements in automating sample prep and image segmentation to help generate meaningful statistics from 3DSEM data.

Date: Tuesday, June 23, 2020 2:30 PM - 3:30 PM SGT
Speaker: Joel Mancuso (ZEISS)

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