ZEISS On Your Campus (ZOYC) Online is comprised of free live online webinars with your local account team.
ZOYC Online has three main goals:
1. Provide education focused on better utilisation of your current microscopy equipment, which can lead to:
- Higher quality imaging and faster time to results
- A better understanding of the data that are collected
- Improved experimental design
2. Bring awareness of new and emerging microscopy trends and technologies.
3. Connect live with your local ZEISS account team.
Samuel Ko, BSc (Hons.), MPhil., PhD
Head of Product and Application Sales Specialist
Dr Samuel Ko studied Biochemistry in Hong Kong with a particular focus on the cellular response of tumour necrosis factor-alpha-induced apoptosis in mouse fibroblast cell line L929 during his MPhil and PhD research, by using fluorescent imaging techniques such as Confocal Laser Scanning Microscopy (CLSM). He received his PhD from The Chinese University of Hong Kong in 2001. From 2001 to 2005, he worked as a post-doctoral fellow at Department of Surgery, University of Hong Kong, where he investigated carcinogenesis of gastric adenocarcinoma. Since August 2005, Samuel joins Carl Zeiss Singapore as a regional application specialist. He is mainly in charge of the products of CLSM, SuperResolution Microscopy, Lightsheet Fluorescence Microscopy (LSFM) and PALM MicroBeam LCM (Laser Capture Microdissection).
Material’s properties are strongly linked to its microstructure, such as grain size, porosity, phase and non-metallic inclusions. Light microscopy is a powerful tool for evaluating a material’s microstructure. But extracting meaningful results using traditional image analysis can be challenging, especially for new materials or materials with multiple phases. For instance, magnetic materials being developed for use in electric motors consist of complex structures. Segmentation of these structures in different phases can prove difficult with traditional image analysis techniques. This webinar introduces a comprehensive solution for microstructure analysis and presents standardized techniques for metallography investigation.
Take the opportunity and learn
- How machine learning-based algorithms can be utilized to segment challenging images and help characterize functional materials and advanced metals
- What is important when choosing a microscope for metallography
- What the challenges are in characterizing new materials with multiple phases
- How to overcome these challenges with machine learning tools
This webinar primarily addresses
- Researchers in materials science
- Working in the field of metallography
- Working in QA/QC for materials
Among the most critical artefacts to consider in widefield fluorescence microscopy arises from, the fact that regardless of the focal point, illumination from the objective produces fluorescence throughout the entire specimen volume.
Imaging of thick specimens in fluorescence microscopy is then compromised by signal originating from regions above and below the focal plane. The result is that sharp image information from the focal plane is overlaid with blurred image information arising from a distant area, reducing contrast and resolution in the axial (z) dimension. Furthermore, three-dimensional (3D) reconstruction of the specimen is not possible under these conditions.
Aside from using laser confocal technique, this webinar explores how to get better fluorescence images with your widefield microscope by different image post-processing methods as well as using the structured-illumination technique with Apotome.2
As coatings and surface treatment technology have evolved, modern microscopy has offered more automated, more precise multidimensional data to characterise them. A deeper understanding of coatings, corrosion, roughness and layers in metallic materials has enabled the development of surfaces optimised for corrosion resistance, functionality, joining and aesthetics. ZEISS Microscopy solutions offer a range of multimodal techniques in two and three dimensions for understanding the thin layers which make a big difference to functionality.
Electron backscatter diffraction (EBSD) is a powerful tool in providing the metals researcher with crystallographic information of the grains and precipitates in metal alloys, so critical in determining the performance and durability of a metal in service. The focused ion beam scanning electron microscope (FIB-SEM) allows three-dimensional imaging of the tiniest features, and ion milling is a fine operation capable of generating surfaces able to be analyzed by EBSD. The ZEISS Crossbeam Laser can rapidly ablate material from samples to access deeply buried features, and this webinar explains how recent research has determined how surfaces can now be prepared through laser ablation alone and analyzed by EBSD without the need for time-consuming fine polishing. This technique enables rapid analysis of deeply buried features in streamlined workflows.
Additive manufacturing opens up new possibilities in the design and manufacture of structural components of complex geometries that were never before possible with traditional subtractive techniques. Selective laser melting techniques to directly write 3D patterns is one of the most widely utilized and studied AM technique. The microstructural characteristics of the powder used for the selective melting process play the most crucial role in the final part quality and performance. Hence, a thorough analysis of the powder is critical. In this presentation, we take a look at the various advanced microscopy techniques and solutions that ZEISS offers for powder characterization. The talk presents several examples from electron and X-ray methods to characterize both powders and fully finished intricate 3D geometry parts produced by AM, both destructively and non-destructively.
Fuel cells are complex three-dimensional electrochemical devices composed of multiple materials with features spanning many orders of magnitude. While they are increasingly used for both mobile and stationary power generation, the performance of the devices is intricately linked to the details of the internal microstructure. However, since they operate in non-ambient conditions, detailed investigations into microstructural evolution have historically been challenging. In this webinar, we discuss how advanced ZEISS microscopy techniques can reveal complex ageing and degradation mechanisms in polymer electrolyte fuel cells and pave the way towards advanced device development.
- Polymer electrolyte fuel cells are complex energy conversion devices with performance properties linked to the 3D microstructure
- In situ 3D imaging is critical for understanding fuel cell degradation mechanisms
- ZEISS X-ray microscopy enables unprecedented access to microstructural evolution in operational fuel cell devices
Can a scanning electron microscope image magnetic material?” This is a common question asked by many people. There are legitimate concerns when trying to put magnetic samples in an SEM: will the magnetic field from the sample disturb the imaging? Will the sample be attracted into the lens and damage the SEM? In this webinar, these questions will be discussed in detail. Several examples will be given to highlight the correct method to image magnetic materials. In the end, a special contrast mechanism to image magnetic domains in SEM will also be explored.
Field Emission Scanning Electron Microscopy (FESEM) and Atomic Force Microscopy (AFM) deliver complementary sample information which helps scientists to gain a complete and deep understanding of their samples. The fully integrated advanced FESEM /AFM solution enables not only in situ multiple imaging modalities but also fast and precise sample/cantilever navigation as well as live interactive measurements using sample manipulations such as e-beam induced effect and interaction between a functional cantilever and the local sample feature.
In this webinar, we will highlight the benefits of the unique, fully integrated FESEM/AFM solution based on the latest development. The full functionalities of both FESEM and AFM will be addressed, in particular, the real in situ environment due to field-free lens design, the complete variety of AFM modes comparable to desktop AFM as well as the seamless integration in hardware and software.
We will show how combined in situ FESEM/AFM imaging approaches provide a basis for easier and more efficient characterization workflows and a more complete understanding of the direct links of surface structure and composition with the local electrical or other physical properties. In doing so, using many application examples in situ measurements will be demonstrated and discussed in detail.